Gated vertical punch through device used as a high...

Details Gated vertical punch through device used as a high... Gated vertical punch through device used as a high...

2006-07-11

2006-07-11

Ho, Tuan (Department: 2615)

Television

Camera, system and detail

Solid-state image sensor

C257S230000, C250S208100

Reexamination Certificate

active

07075575

ABSTRACT:
A charge detection system used in an image sensor consists of the vertical punch through transistor with the gate surrounding its source and connected to it. The charge detector has a large conversion gain, high dynamic range, low reset feed through, and low noise. It senses charge nondestructively, which avoids generation of kTC noise. Additional embodiments of the invention include a standard reset gate option, a resistive reset gate option, and a lateral punch through transistor reset option to minimize the reset feed through. The charge detection system can be used in all know CCD image sensor architectures as well as in most CMOS image sensor architectures.

REFERENCES:
patent: 4977584 (1990-12-01), Kohno et al.
patent: 5625210 (1997-04-01), Lee et al.
patent: 5872371 (1999-02-01), Guidash et al.
patent: 5904493 (1999-05-01), Lee et al.
patent: 6111281 (2000-08-01), Isogai
patent: 6580106 (2003-06-01), Hynecek
patent: 6617562 (2003-09-01), Mann
patent: 6768149 (2004-07-01), Mann et al.
patent: 61-188965 (1986-08-01), None

Affiliated with

Also associated with

Rating

Gated vertical punch through device used as a high... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Gated vertical punch through device used as a high..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Gated vertical punch through device used as a high... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3536728