Gate oxide film structure for a solid state image pick-up...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Charge transfer device

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S233000, C257S249000, C257S411000

Reexamination Certificate

active

06946694

ABSTRACT:
In a solid-state image pick-up device in which a photoelectric converting section formed on a semiconductor substrate and a gate oxide film of a transfer path of a charge coupled device (CCD) which is close to the photoelectric converting section are constituted by a laminated film comprising a silicon oxide film (SiO) and a silicon nitride film (SiN), the gas oxide film has a single layer structure in which at least an end on the photoelectric converting section side of the gate oxide film does not contain the silicon nitride film.

REFERENCES:
patent: 5581099 (1996-12-01), Kusaka et al.
patent: 5699114 (1997-12-01), Park

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Gate oxide film structure for a solid state image pick-up... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Gate oxide film structure for a solid state image pick-up..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Gate oxide film structure for a solid state image pick-up... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3389646

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.