Gate drive circuitry for non-isolated gate semiconductor...

Miscellaneous active electrical nonlinear devices – circuits – and – Gating – Signal transmission integrity or spurious noise override

Reexamination Certificate

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Details

C327S386000, C327S534000, C327S535000, C327S537000

Reexamination Certificate

active

07915944

ABSTRACT:
One embodiment is a gate drive circuitry for switching a semiconductor device having a non-isolated input, the gate drive circuitry having a first circuitry configured to turn-on the semiconductor device by imposing a current on a gate of the semiconductor device so as to forward bias an inherent parasitic diode of the semiconductor device. There is a second circuitry configured to turn-off the semiconductor device by imposing a current on the gate of the semiconductor device so as to reverse bias the parasitic diode of the semiconductor device wherein the first circuitry and the second circuitry are coupled to the semiconductor device respectively through a first switch and a second switch.

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Kazuaki Mino, Simon Herold and J. W. Kolar; “A Gate Drive Circuit for Silicon Carbide JFET”; CH-8092 Zurich / Switzerland /Europe; 0-7803-7906-3/03/$17.00 02003 IEEE; On pp. 1162-1166.
Bjäorn Allebrand and Hans-Peter Nee; “Design of a Gate Drive Circuit for use with SiC JFETs”; http://www.ee.kth.se/php/modules/publications/reports/2002/IR-EE-EME—2002—018.pdf ; 4pages.
Domes D, Werner R, Hofmann W, Domes K and Kraub S ; “A New, Universal and Fast Switching Gate-Drive-Concept for SiC-JFETs based on Current Source Principle”; ISSN: 0275-9306; ISBN: 0-7803-9716-9 INSPEC Accession No. 9121978; Digital Object Identifier: 10.1109/PESC.2006.1712169; Current Version Published: Oct. 23, 2006; On pp. 1-6.

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