Electricity: electrical systems and devices – Safety and protection of systems and devices – Load shunting by fault responsive means
Reexamination Certificate
2007-09-25
2007-09-25
Jackson, Stephen W. (Department: 2836)
Electricity: electrical systems and devices
Safety and protection of systems and devices
Load shunting by fault responsive means
Reexamination Certificate
active
10971271
ABSTRACT:
The present disclosure is directed toward electrostatic device protection for semiconductor devices. A circuit for providing electro-static discharge (ESD) protection for a semiconductor circuit may comprise a first circuit coupled to a voltage bus and to the gate of a first transisto, the first circuit comprising a metal-oxide semiconductor (MOS) transistor; and a second circuit coupled to the voltage bus, to ground, and to the gate of the transistor of the first circuit. The MOS transistor of the first circuit may be a PMOS transistor whose source is coupled to the voltage bus, whose drain is coupled to the gate of the first transistor, whose gate is coupled to the second circuit, and whose well is coupled to a floating N-well.
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Chen Ker-Min
Chiang Cheng-Ming
Benenson Boris
Duane Morris LLP
Jackson Stephen W.
Taiwan Semiconductor Manufacturing Company
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