Gasphase ion source for time-of-flight mass-spectrometers with h

Details Gasphase ion source for time-of-flight mass-spectrometers with h Gasphase ion source for time-of-flight mass-spectrometers with h

1994-07-01

1996-08-06

Anderson, Bruce C.

Radiant energy

Ion generation

Field ionization type

250288, H01J 3708, H01J 4900, B01D 5944

Patent

active

055436242

ABSTRACT:
To achieve a high mass resolution in a time-of-flight mass-spectrometer with gasphase ion source, the initial velocity components in the direction of acceleration of the ion source must be kept small. This can be done by injection the analyte gas or ion beam at right angles to the direction of acceleration into the ion source. When the direction of acceleration and the direction of the analyte gas or ion beam or not colinear, the amount of unwanted gas ballast in the drift space of the time-of-flight mass-spectrometer will be less. This will increase the dynamic range of the mass-spectrometer. The heavier an ion is, the more its path will deviate from the axis of the ion source and if it deviates too far from the axis of the ion source it will be lost. This effect gives the limit of the mass range of such an ion source. If the electrical deflection field for these ions is already within the acceleration region of the ion source, its mass range can significantly be enlarged.

REFERENCES:
patent: 3577165 (1971-05-01), Helliwell et al.
patent: 3634683 (1972-01-01), Bakker
patent: 3922544 (1975-11-01), Maul et al.
patent: 4362936 (1982-12-01), Hofmann et al.
patent: 4517462 (1985-05-01), Boyer et al.
patent: 5117107 (1992-05-01), Guilhous et al.
J. M. B. Bakker, A beam-modulated time-of-flight mass spectrometer Part II: experimental work, J. Physics E: Scient. Instrum. 7(1974), pp. 364-378.
T. Bergmann, T. P. Martin & H. Schaber, High resolution time-of-flight mass spectrometer, Rev. Sci. Instrum. 60(4), Apr. 1989, pp. 792-793.

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