Gaseous trace impurity analyzer and method

Details Gaseous trace impurity analyzer and method Gaseous trace impurity analyzer and method

1978-12-18

1980-07-29

Ruehl, Charles A.

Measuring and testing

Gas analysis

Gas chromatography

73 17A, G01N 2502

Patent

active

042144736

ABSTRACT:
Simple apparatus for analyzing trace impurities in a gas, such as helium or hydrogen, comprises means for drawing a measured volume of the gas as sample into a heated zone. A segregable portion of the zone is then chilled to condense trace impurities in the gas in the chilled portion. The gas sample is evacuated from the heated zone including the chilled portion. Finally, the chilled portion is warmed to vaporize the condensed impurities in the order of their boiling points. As the temperature of the chilled portion rises, pressure will develop in the evacuated, heated zone by the vaporization of an impurity. The temperature at which the pressure increase occurs identifies that impurity and the pressure increase attained until the vaporization of the next impurity causes a further pressure increase is a measure of the quantity of the preceding impurity.

REFERENCES:
patent: 3446056 (1969-05-01), Koch
patent: 3589169 (1971-06-01), Lafitte

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