Gas emission spectrometer and method

Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

356311, 356417, G01J 330

Patent

active

054124670

ABSTRACT:
A gas emission spectrometer and method for analyzing a continuously flowing gas stream using gas emission spectroscopy to measure low concentration levels of one or more gas/vapor impurities in the gas stream. Alternating power is applied to an electric discharge source to generate emissive radiation which is filtered into an optical signal at the emission wavelength of a preselected impurity gas. The optical signal is converted into an electrical signal which is selectively amplified within a narrow frequency range centered at substantially twice the excitation frequency of the alternating power source. The impurity concentration is measured from the amplified signal upon rectification.

REFERENCES:
patent: 2943223 (1960-06-01), Fay
patent: 3032654 (1962-05-01), Fay et al.
patent: 3645629 (1972-02-01), Dagnall
patent: 4801209 (1989-01-01), Wadlow
patent: 5036204 (1991-07-01), Leyden
patent: 5135604 (1992-08-01), Kumar et al.
"Emission Spectrometric Method And Analyzer For Traces of Nitrogen in Argon", Analytical Chemistry, vol. 34, No. 10, Sep. 1962, pp. 1254-1260, Fay, Homer, Mohr, Paul H. And Cook, Gerhard A.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Gas emission spectrometer and method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Gas emission spectrometer and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Gas emission spectrometer and method will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1141519

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.