Measuring and testing – Gas analysis – Detector detail
Patent
1998-09-01
2000-10-10
Williams, Hezron
Measuring and testing
Gas analysis
Detector detail
422 98, 702 22, G01N 900, G01N 2700, G01N 1900
Patent
active
061289450
ABSTRACT:
A metal oxide semiconductor is subjected to a temperature change, and signals measured at two timings in the course of the temperature change are used to define a two-dimensional topological space. In the topological space, two axis, an axis indicating the concentration of the gas to be detected and an axis corresponding to drift are defined, and the topological space is represented by an oblique coordinate system. The gas concentration is determined from projection of measured data onto the gas concentration axis.
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Analytical Chemistry, vol. 68, No. 13, Jul. 1, 1996, P.2067-2072, "Gas Sensing Based on a Nonlinear Response: Discrimination between Hydrocarbons and Quantifiation of Individual . . ".
Shinnishi Kazuya
Shioiri Akira
Takamatsu Kazuko
Udaka Toshihiro
Figaro Engineering Inc.
Politzer Jay L.
Williams Hezron
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