Gas-based backside protection during substrate processing

Coating apparatus – Gas or vapor deposition – Work support

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

29 2501, 118720, 118725, 156345, H01L 2168

Patent

active

052307417

ABSTRACT:
A suitable inert gas such as argon or a mixture of inert and reactive gases such as argon and hydrogen is introduced onto the backside of wafers being processed in a CVD reactor during the deposition of tungsten or other metals, metal nitrides and silicides, to avoid deposition of material on the backside of the wafers being processed. Each process station includes a gas dispersion head disposed over a platen. A vacuum chuck including a number of radial and circular vacuum grooves in the top surface of the platen is provided for holding the wafer in place. A platen heater is provided under the platen. Backside gas is heated in and about the bottom of the platen, and introduced through a circular groove in the peripheral region outside of the outermost vacuum groove of the vacuum chuck. Backside gas pressure is maintained in this peripheral region at a level greater than the CVD chamber pressure. In this manner, backside gas vents from beneath the edge of the wafer on the platen and prevents the process gas from contacting the wafer backside.

REFERENCES:
patent: 4261762 (1981-04-01), King
patent: 4457359 (1984-07-01), Holden
patent: 4466872 (1984-08-01), Einbinder
patent: 4508161 (1985-04-01), Holden
patent: 4512391 (1985-04-01), Harra
patent: 4527620 (1985-07-01), Pedersen et al.
patent: 4535834 (1985-08-01), Turner
patent: 4567938 (1986-02-01), Turner
patent: 4575408 (1986-03-01), Bok
patent: 4603466 (1986-08-01), Morley
patent: 4682566 (1987-07-01), Aitken
patent: 4687682 (1987-08-01), Koze
patent: 4709655 (1987-12-01), Van Mastright
patent: 4738748 (1988-04-01), Kisa
patent: 4743570 (1988-05-01), Lamont, Jr.
patent: 4817558 (1989-04-01), Itoh
patent: 4857142 (1989-08-01), Syverson
patent: 4911103 (1990-03-01), Davis et al.
patent: 4990374 (1991-02-01), Keeley et al.
patent: 5033538 (1991-07-01), Wagner et al.
Benveniste, "Wafer Cooling in High Current Ion Implanter," Nuclear Instruments and Methods in Physics Research B21, North-Holland, Amsterdam, 1987, pp. 366-371.
Bogle-Rohwer et al., "Wall Profile Control in a Triod Etcher," Solid State Technology, Apr. 1985, pp. 251-255.
Douglas-Hamilton et al, "End Station Design and Wafer Quality Control For A High Current Oxygen Implantation," Nuclear Instruments and Methods in Physics Research B21, North-Holland, Amsterdam, 1987, pp. 324-327.
Durzinko, et al., "Studies of Anhydrous HF Peroxidation Treatment of Silicon Surfaces," Abstract No. 257.
Egerton et al., "Positive Wafer Temperature Control to Increase Dry Etch Throughout and Yield," Solid State Technology, Aug. 1982, pp. 84-87.
Evans, "A Generalized Mathematical Model For Wafer Cooling With Gas," Nuclear Instruments and Methods in Physics Research B21, North-Holland, Amsterdam, 1987, pp. 385-390.
Hammer, "Cooling Ion Implantation Target," IBM Technical Disclosure Bulletin, vol. 19, No. 6, Nov. 1976, pp. 2270-2271.
Hoffman et al., "Individual Wafer Metallization Utilizing Load-Locked, Close-Coupled Conical Magnetron Sputtering," Solid State Technology, Feb. 1981, pp. 105-11 and 120.
Hussla et al., "In Situ Silicon-Wafer Temperature Measurements During RF Argon-Ion Plasma Etching via Fluoroptic Thermometry," J. Phys. D: Appl. Physc. 20, 1987, pp. 889-896.
Kawai et al., "PR-80 High Current Ion Implantation Machine," Nuclear Instruments and Methods in Physics Research B21, North-Holland, Amsterdam, 1987, pp. 239-244.
King et al., "Experiments On Gas Cooling of Wafers," Nuclear Instruments and Methods 189, North-Holland Publishing Company, 1981, pp. 169-173.
Komatsu et al., "A High Throughput End Station of a High Current Ion Implantation," Nuclear Instruments and Methods in Physics Research B21, North-Holland, Amsterdam, 1987, pp. 317-320.
Mack, "Wafer Cooling in Ion Implantation," In Ion Implantation: Equipment and Techniques, H. Ryssel and H. Glawischnig, eds., Springer-Verlag, Berlin, 1983, pp. 221-232.
Mathod, "Design Consideration For A High Pressure, High Etch Rate Single Wafer Reactor," The Electrochemical Society, Proceedings of the Sixth Symposium on Plasma Processing, vol. 87-86, 1987, pp. 134-138.
Mears, "New Method of Solid State Wafer Cooling in the Extron 1000 High Current Ion Implantation System," Nuclear Instruments and Methods in Physics Research B37/38, North-Holland, Amsterdam, 1989, pp. 460-463.
Nakamura et al., "Effect of Wafer Temperature on Reactive Ion Etching," The Electro-Chemical Society, Proceedings of the Symposium on Dry Process, vol. 88-7, 1988, pp. 78-85.
Ryding, "Target Chambers For Ion Implantation Using Mechanical Scanning," Nuclear Instruments and Methods 189, North-Holland Publishing Company, 1981, pp. 239-251.
Ryssel et al., "Ion Implantation," John Wiley & Sons, Chichester, 1986, pp. 152-160.
Saitoh, et al., "Impurity Gettering of Polycrystalline Solar Cells Fabricated from Refined Metallurgical-Grade Silicon," IEEE Transactions on Electron Devices, vol. Ed-27, No. 4, Apr. 1980, pp. 671-677.
Scaife, "The Veeco 4840 Automatic Implant System," Nuclear Instruments and Methods in Physics Research B21, North-Holland, Amsterdam, 1987, pp. 258-263.
Steen, et al., "The Precision Implant 9000, A New Concept In Ion Implantation Systems," Nuclear Instruments and Methods in Physics Research B21, North-Holland, Amsterdam, 1987, pp. 328-333.
Syverson et al., "Contamination Aspects of Anhydrous HF Gas Processing," Solid State Technology, Oct. 1988, pp. 101-104.
Taylor et al., "200 mm End Station For Ion Beam Implanters," Nuclear Instruments and Methods in Physics Research B21, North-Holland, Amsterdam, 1987, pp. 224-228.
Turner et al., "Advances in Cassette-to-Cassette Sputtercoating Systems," Solid State Technology, Jul. 1983, pp. 115-123.
Wauk, "New Ion Implantation System With Advanced Process Capabilities," Nuclear Instruments and Methods in Physics Research B21, North-Holland, Amsterdam, 1987, pp. 280-284.
VLSI Research Inc., "Integrated Processing Systems," Nov. 1990, p. 12.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Gas-based backside protection during substrate processing does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Gas-based backside protection during substrate processing, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Gas-based backside protection during substrate processing will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2339855

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.