Measuring and testing – Gas analysis – With compensation detail
Patent
1996-08-22
1998-07-14
Williams, Hezron E.
Measuring and testing
Gas analysis
With compensation detail
250373, G01N 2100
Patent
active
057807167
ABSTRACT:
A gas analyzing apparatus includes a sample gas line with a sample line valve for providing a sample gas, and a reference gas line with a reference line valve for providing a reference gas. A first gas analyzer is connected to the sample line downstream of the sample line valve, and a second gas analyzer is connected to both the sample and reference gas lines downstream of the valves. The lines are configured such that sample gas and reference gas may be alternately provided to the second gas analyzer either directly or indirectly via the first gas analyzer.
REFERENCES:
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patent: 3845309 (1974-10-01), Helm et al.
patent: 4285245 (1981-08-01), Kennedy
patent: 4388411 (1983-06-01), Lovelock
patent: 5357809 (1994-10-01), Vander Heyden
patent: 5542284 (1996-08-01), Layzell et al.
Akiyama Shigeyuki
Fujiwara Masahiko
Inoue Satoshi
Oida Takuji
Shimizu Naohito
Fayyaz Nashmiya
Horiba Ltd.
Williams Hezron E.
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