Radiant energy – Ionic separation or analysis – Ion beam pulsing means with detector synchronizing means
Patent
1993-02-11
1994-04-19
Berman, Jack I.
Radiant energy
Ionic separation or analysis
Ion beam pulsing means with detector synchronizing means
250282, H01J 4940
Patent
active
053047974
ABSTRACT:
Ultra-low concentrations of impurities such as water in a highly-purified gas are analyzed by a system having an ion source chamber and a drift chamber. The ion source chamber ionizes one of a sample gas and a carrier gas to produce main component ions, and the other of the sample gas and carrier gas is introduced into the drift chamber. The invention controls the residence time of main component ions in one of the first and second chambers to be shorter than the mean reaction time of main component ions and impurity molecules of the sample gas in the one of the first and second chambers.
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Ametek 5700 Moisture Analyzer.
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"Determination of Trace Impurities in Highly Purified Nitrogen Gas by Atmospheric Pressure Ionization Mass Spectrometry", Analytical Chemistry, vol. 55, No. 3, pp. 477-481, 1983.
"Plasma Chromatography", Analytical Chemistry, vol. 46, No. 8, pp. 710A-720A, Jul. 1974.
Hasumi Keiji
Irie Takashi
Mitsui Yasuhiro
Berman Jack I.
Hitachi , Ltd.
Hitachi Tokyo Electronics Co. Ltd.
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