Measuring and testing – Gas analysis – With compensation detail
Patent
1994-11-17
1996-07-02
Williams, Hezron E.
Measuring and testing
Gas analysis
With compensation detail
73 233, 73863, 7386481, 73 2902, G01N 3000, G01N 3100, A61B 508
Patent
active
055310966
ABSTRACT:
A method for gas analysis includes the steps of extracting a gas sample from a gas to be analyzed with respect to one or more of its gas components, measuring the flow of the extracted gas sample, and adding a replacement gas to the gas in the same amount as the extracted sample in order to minimize the impact on the main gas flow of the extraction of the gas sample. The replacement gas can consist of the same gas components constituting the gas sample. A gas analyzer for performing the method is also disclosed.
REFERENCES:
patent: 3861195 (1975-01-01), vom Hagen
patent: 4109509 (1978-08-01), Cramer et al.
patent: 4150670 (1979-04-01), Jewett et al.
patent: 4169465 (1979-10-01), Walls et al.
patent: 4202352 (1980-05-01), Osborn
patent: 4441356 (1984-04-01), Bohl
patent: 4459994 (1984-07-01), Slemeyer
patent: 4476708 (1984-10-01), Baker et al.
patent: 4509359 (1985-04-01), Gedeon et al.
patent: 4619269 (1986-10-01), Cutter et al.
patent: 4756670 (1988-07-01), Arai
patent: 5069220 (1991-12-01), Casparie et al.
patent: 5187972 (1993-02-01), DeFriez
patent: 5398695 (1995-03-01), Anderson et al.
Siemens Elema AB
Wiggins J. David
Williams Hezron E.
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