Electricity: measuring and testing – Using ionization effects – For analysis of gas – vapor – or particles of matter
Patent
1989-11-27
1992-06-30
Wieder, kenneth A.
Electricity: measuring and testing
Using ionization effects
For analysis of gas, vapor, or particles of matter
250379, G01N 2762
Patent
active
051266768
ABSTRACT:
A gas-amplified ionization detector for gas chromatrography which possesses increased sensitivity and a very fast response time. Solutes eluding from a gas chromatographic column are ionized by UV photoionization of matter eluting therefrom. The detector is capable of generating easily measured voltage signals by gas amplification/multiplication of electron products resulting from the UV photoionization of at least a portion of each solute passing through the detector.
REFERENCES:
patent: 3087113 (1963-04-01), Foster
patent: 3585003 (1971-06-01), Scolnick
patent: 3676682 (1972-07-01), Falk
patent: 3870880 (1975-03-01), Lovelock
patent: 4028617 (1977-06-01), Kamo et al.
patent: 4398152 (1983-08-01), Leveson
patent: 4508685 (1985-04-01), Sisti et al.
patent: 4587429 (1986-05-01), Tomoda et al.
patent: 4769548 (1988-09-01), Burtscher et al.
patent: 4837440 (1989-06-01), Burtscher et al.
Industrial and Engineering Chemistry, vol. 52, #11; pp. 61A-64A, Ionization Detectors for Gas Chromatography, Stirling et al, Nov. 1960.
Analytical Chemistry, vol. 33; #2; pp. 162-178, Ionization Methods for Analysis of Gases and Vapors, Lovelock Feb. 1960.
Breeden David E.
Hamel Stephen D.
Moser William R.
Regan Naura K.
The United States of America as represented by the United States
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