Gap width probe and method

Electricity: measuring and testing – Conductor identification or location – Inaccessible

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

33783, 324 61R, G01R 2726

Patent

active

048412244

ABSTRACT:
A probe for determining the thickness of an interface gap between two surfaces is disclosed. The probe includes an inflatable bladder, which can be inserted into a gap and inflated, such that the sides of the bladder contact the planes. A distance-measuring device is mounted within the cavity of the bladder and is suitable for measuring the distance between the sides of the bladder. Passive electrical circuitry for use as the distance-measuring device is also disclosed. Passive electrical circuitry has an electrical property that varies as the distance between the passive electrical elements varies. In the case of a probe utilizing capacitive circuitry, three relationally positioned measuring electrodes and a common electrode are mounted within the bladder cavity such that the measuring and common electrical are in facing relationship and move away from each other as the bladder is inflated. When the bladder is inflated with a dielectric fluid, the electrodes are pressed flat against the surfaces. Once the electrodes are separated, a value for the capacitance at each measuring electrode's position is obtained. The capacitance value is indicative of the distance between the surfaces. Two-dimensional gap taper information, as well as single-dimension thickness information, can thus be produced.

REFERENCES:
patent: 4160204 (1979-07-01), Holmgren et al.
patent: 4178692 (1979-12-01), Schultz
patent: 4328621 (1982-05-01), Benjamin
patent: 4404481 (1983-09-01), Ide et al.
patent: 4482860 (1984-11-01), Risko
patent: 4489495 (1984-12-01), Scheinecker
patent: 4528451 (1985-07-01), Petric et al.
patent: 4538069 (1985-08-01), Shambroom et al.
patent: 4539835 (1985-09-01), Shambroom et al.
patent: 4572000 (1986-02-01), Kooiman
patent: 4649752 (1987-03-01), Turner
patent: 4668912 (1987-05-01), Junker

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Gap width probe and method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Gap width probe and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Gap width probe and method will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-527352

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.