Gang flipping for IC packaging

Details Gang flipping for IC packaging Gang flipping for IC packaging

2007-03-26

2009-02-17

Lindsay, Jr., Walter L (Department: 2812)

Semiconductor device manufacturing: process

Semiconductor substrate dicing

C438S464000, C438S113000, C257SE21602, C257SE21705

Reexamination Certificate

active

07491625

ABSTRACT:
A method of handling an IC wafer that includes a multiplicity of dice is described. Solder bumps are formed on bond pads on the active surface of the wafer. The back surface of the bumped wafer is adhered to a first mount tape. The wafer is singulated while it is still secured to the first tape to provide a multiplicity of individual dice. The active surfaces of the singulated dice are then adhered to a second tape with the first tape still adhered to the back surfaces of the dice. The first tape may then be removed. In this manner, the back surfaces of the dice may be left exposed and facing upwards with the active surfaces of the dice adhered to the second tape. The described method permits the use of a conventional die attach machine that is not designated for use as a flip-chip die attach machine.

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