Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal – Including integrally formed optical element
Reexamination Certificate
2007-08-15
2009-11-10
Trinh, Michael (Department: 2822)
Semiconductor device manufacturing: process
Making device or circuit emissive of nonelectrical signal
Including integrally formed optical element
C438S046000, C438S047000, C257S079000, C257S103000, C257SE21028
Reexamination Certificate
active
07615389
ABSTRACT:
Ga(In)N-based laser structures and related methods of fabrication are proposed where Ga(In)N-based semiconductor laser structures are formed on AlN or GaN substrates in a manner that addresses the need to avoid undue tensile strain in the semiconductor structure. In accordance with one embodiment of the present invention, a Ga(In)N-based semiconductor laser is provided on an AlN or GaN substrate provided with an AlGaN lattice adjustment layer where the substrate, the lattice adjustment layer, the lower cladding region, the active waveguiding region, the upper cladding region, and the N and P type contact regions of the laser form a compositional continuum in the semiconductor laser. Additional embodiments are disclosed and claimed.
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A1GaN-Cladding-Free Nonpolar InGaN/GaN Laser Diodes, Feezell, et al Japanese Journal of Applied Physics, vol. 46, No. 13, 2007, pp. L284-L286.
Bhat Rajaram
Napierala Jerome
Sizov Dmitry
Zah Chung-En
Adusei-Poku Kwadjo
Corning Incorporated
Trinh Michael
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