Active solid-state devices (e.g. – transistors – solid-state diode – Heterojunction device – Field effect transistor
Reexamination Certificate
2006-03-30
2011-10-25
Gurley, Lynne (Department: 2811)
Active solid-state devices (e.g., transistors, solid-state diode
Heterojunction device
Field effect transistor
C257S282000, C257S283000, C257SE21621, C257SE21624, C257SE29246
Reexamination Certificate
active
08044433
ABSTRACT:
A semiconductor device includes a substrate, a GaN-based semiconductor layer formed on the substrate, a gate electrode embedded in the GaN-based semiconductor layer, a source electrode and a drain electrode formed on both sides of the gate electrode, a first recess portion formed between the gate electrode and the source electrode, and a second recess portion formed between the gate electrode and the drain electrode. The first recess portion has a depth deeper than that of the second recess portion.
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Kawasaki Takeshi
Nakata Ken
Yaegashi Seiji
Eudyna Devices Inc.
Gurley Lynne
Miyoshi Jesse Y
Westerman Hattori Daniels & Adrian LLP
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