Gamma ray detector with improved resolution and method of fabric

Radiant energy – Invisible radiant energy responsive electric signalling – Semiconductor system

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25037009, 25037012, G01T 124, H01L 310256

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active

056169256

ABSTRACT:
Gamma ray detectors (20, 130) are provided with a detector layer (30) that is formed of Hg.sub.x Cd.sub.1-x-y Zn.sub.y Te, wherein 0<x<0.05 and 0.ltoreq.y<0.5. The Hg percentage in the group II sublattice of this detector layer is limited to replace Cd vacancies. These Cd vacancies are native point defects which degrade the resolution of gamma ray detectors because they facilitate early electron-hole recombination and time delays of current carriers.

REFERENCES:
patent: 5391882 (1995-02-01), Rhiger
Sen, S., et al. "Crystal Growth of Large-Area Single-Crystal CdTe and CdZnTe", Journal of Crystal Growth 86 (1988), North-Holland, Amsterdam, pp. 111-117.
Grove, A.S., Physics and Technology of Semiconductor Devices, John Wiley & Sons, New York, 1967, p. 46.
Hogg, J.H.C., et al., "Chemical Diffusion of Hg in CdTe", Materials Science and Engineering, B16 (1993), pp. 195-198.
Jones, E. D., et al., "The diffusion of mercury in cadmium telluride", Journal of Crystal Growth 118, (1992), pp. 1-13.
Siffert, P., "Cadmium Telleride Detectors and Applications", Material Resources Society Symposium, vol. 16 (1983), pp. 87-114.

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