Active solid-state devices (e.g. – transistors – solid-state diode – Thin active physical layer which is – Heterojunction
Reexamination Certificate
2007-08-31
2011-11-08
Vu, David (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Thin active physical layer which is
Heterojunction
C257SE33008, C438S022000
Reexamination Certificate
active
08053757
ABSTRACT:
One embodiment of the present invention provides a gallium nitride (GaN)-based semiconductor light-emitting device (LED) which includes an n-type GaN-based semiconductor layer (n-type layer); an active layer; and a p-type GaN-based semiconductor layer (p-type layer). The n-type layer is epitaxially grown by using ammonia gas (NH3) as the nitrogen source prior to growing the active layer and the p-type layer. The flow rate ratio between group V and group III elements is gradually reduced from an initial value to a final value. The GaN-based LED exhibits a reverse breakdown voltage equal to or greater than 60 volts.
REFERENCES:
patent: 6017774 (2000-01-01), Yuasa et al.
patent: 6091085 (2000-07-01), Lester
patent: 6881983 (2005-04-01), Narayan et al.
patent: 7436045 (2008-10-01), Kobayakawa et al.
Fang Wenqing
Jiang Fengyi
Mo Chunlan
Pu Yong
Wang Li
Lattice Power (Jiangxi) Corporation
Park Vaughan Fleming & Dowler LLP
Vu David
Yao Shun
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