Active solid-state devices (e.g. – transistors – solid-state diode – Incoherent light emitter structure – With particular semiconductor material
Reexamination Certificate
2006-08-29
2006-08-29
Louie, Wai-Sing (Department: 2814)
Active solid-state devices (e.g., transistors, solid-state diode
Incoherent light emitter structure
With particular semiconductor material
C257S022000, C257S064000, C257S613000
Reexamination Certificate
active
07098487
ABSTRACT:
There is provided a GaN single crystal at least about 2 millimeters in diameter, with a dislocation density less than about 104cm−1, and having no tilt boundaries. A method of forming a GaN single crystal is also disclosed. The method includes providing a nucleation center, a GaN source material, and a GaN solvent in a chamber. The chamber is pressurized. First and second temperature distributions are generated in the chamber such that the solvent is supersaturated in the nucleation region of the chamber. The first and second temperature distributions have different temperature gradients within the chamber.
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D'Evelyn Mark Philip
Hong Huicong
LeBoeuf Steven
Narang Kristi
Park Dong-Sil
General Electric Company
Louie Wai-Sing
McClintic Shawn A.
Powell, III William E.
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