Gallium nitride-based device and method

Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal – Compound semiconductor

Reexamination Certificate

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C257S014000, C257S015000, C257SE33008, C257SE33023, C257SE33025, C257SE33026, C257SE33027, C257SE33028, C257SE33030, C257SE33031, C257SE33032, C257SE33033, C257SE33034, C257SE33037, C438S046000

Reexamination Certificate

active

07842531

ABSTRACT:
A gallium nitride-based device has a first GaN layer and a type II quantum well active region over the GaN layer. The type II quantum well active region comprises at least one InGaN layer and at least one GaNAs layer comprising 1.5 to 8% As concentration. The type II quantum well emits in the 400 to 700 nm region with reduced polarization affect.

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