Gallium arsenide HBT having increased performance and method...

Active solid-state devices (e.g. – transistors – solid-state diode – Bipolar transistor structure – With base region having specified doping concentration...

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S197000, C257S198000, C257S558000, C257S583000, C438S235000, C438S309000, C438S312000, C438S350000

Reexamination Certificate

active

07019383

ABSTRACT:
According to one exemplary embodiment, a gallium arsenide heterojunction bipolar transistor comprises a collector layer and a first spacer layer situated over the collector layer, where the first spacer layer is a high-doped P+ layer. For example, the first spacer layer may comprise GaAs doped with carbon. The gallium arsenide heterojunction bipolar transistor further comprises a base layer situated over the first spacer layer. The base layer may comprise, for example, a concentration of indium, where the concentration of indium is linearly graded in the base layer. The base layer may comprise InGaAsN, for example. The gallium arsenide heterojunction bipolar transistor further comprises an emitter layer situated over the base layer. The emitter layer may comprise, for example, InGaP.

REFERENCES:
patent: 5177583 (1993-01-01), Endo et al.
patent: 5603765 (1997-02-01), Matloubian et al.
patent: 6563145 (2003-05-01), Chang et al.
patent: 2002/0163014 (2002-11-01), Welser et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Gallium arsenide HBT having increased performance and method... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Gallium arsenide HBT having increased performance and method..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Gallium arsenide HBT having increased performance and method... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3602069

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.