Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2008-03-18
2008-03-18
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S066000, C702S067000, C702S068000, C702S069000, C702S071000, C702S072000, C702S073000, C702S074000, C702S075000, C702S150000, C702S152000, C702S189000, C073S172000, C324S073100, C324S076130, C340S658000, C340S944000, C340S870260
Reexamination Certificate
active
10527847
ABSTRACT:
A gait waveform feature extracting method and an individual identification system extract features of the gait waveform. A one-step waveform corresponding to one step of a walking movement is specified using, as an index, a peak amplitude corresponding to a state where substantially a whole bottom surface of one foot is in contact with the ground and a toe of the other foot is just after leaving the ground among the electric field displacement formed on the human body in accordance with the human body's walking movements. Based on the specified one-step waveform, the features of the one-step waveform are extracted, so that the peak amplitude appears without influence from electric-charge interference between the right and left legs. Accordingly, the one-step waveform reflects the actual one step of the walking movement, and therefore, the features of the one-step waveform can be precisely extracted.
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Barlow John
Kundu Sujoy
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
Sony Corporation
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