Fused off-axis object illumination direct-to-digital...

Optics: measuring and testing – By light interference – Holography

Reexamination Certificate

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C356S514000

Reexamination Certificate

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06963406

ABSTRACT:
Systems and methods are described for rapid acquisition of fused off-axis illumination direct-to-digital holography. A method of recording a plurality of off-axis object illuminated spatially heterodyne holograms, each of the off-axis object illuminated spatially heterodyne holograms including spatially heterodyne fringes for Fourier analysis, includes digitally recording, with a first illumination source of an interferometer, a first off-axis object illuminated spatially heterodyne hologram including spatially heterodyne fringes for Fourier analysis; and digitally recording, with a second illumination source of the interferometer, a second off-axis object illuminated spatially heterodyne hologram including spatially heterodyne fringes for Fourier analysis.

REFERENCES:
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patent: 6262818 (2001-07-01), Cuche et al.
patent: 6809845 (2004-10-01), Kim et al.
patent: 2000-35309 (2000-02-01), None
patent: WO 01/50201 (2001-07-01), None
Hecht, “OPTICS” Third Edition, Adelphi University, published by Addison-Wesley Longman, Inc., pp. 465-469 and 599-602, 1998.
Price, “Off-axis Illumination to Improve DDH Imaging Resolution,” Image Science and Machine Vision Group, Oak Ridge National Laboratory, pp. 1-38, Sep. 2000.
Vishnyakov et al., “Optico-Physical Measurements Linnik Tomographic Microscope for Investigation of Optically Transparent Objects,” Measurement Techniques, vol. 41, No. 18, Oct. 1998, pp. 906-911.
Narumi Tatsuya, “Size Measuring Method by Light Wave Interferometer,” Patent Abstracts of Japan, vol. 2000, No. 5, Sep. 14, 2000, abstract and figure 1.
International Search Report dated Mar. 4, 2004, issued in corresponding international application No. PCT/US03/27575.

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