Fuse link trim algorithm for minimum residual

Coded data generation or conversion – Converter calibration or testing – Trimming control circuits

Reexamination Certificate

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Reexamination Certificate

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07049986

ABSTRACT:
A parameter of an integrated circuit including a first trim array and a second trim array is trimmed by measuring an initial value of the parameter, determining whether the parameter exceeds a reference value, and as long as the parameter exceeds the reference value, repetitively blowing fuses associated with binarily weighted trim elements of the first trim array to eliminate trim contributions thereof to thereby decrease the parameter by weighted amounts corresponding to a present trim array bit number value until either all fuses of the first trim array have been blown or enough have been blown to cause the parameter to be less than a −LSB/2 weight. If the parameter then is less than the −LSB/2 weight, a fuse of the second trim array corresponding to a present bit number is blown to increase the parameter to greater than a +LSB/2 weight. The procedure is repeated until all fuses in one trim array have been blown, to thereby minimize the number of residual trim elements.

REFERENCES:
patent: 4399426 (1983-08-01), Tan
patent: 6151238 (2000-11-01), Smit et al.
patent: 6433714 (2002-08-01), Clapp et al.
patent: 6448911 (2002-09-01), Somayajula

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