Coded data generation or conversion – Converter calibration or testing – Trimming control circuits
Reexamination Certificate
2006-05-23
2006-05-23
Young, Brian (Department: 2819)
Coded data generation or conversion
Converter calibration or testing
Trimming control circuits
Reexamination Certificate
active
07049986
ABSTRACT:
A parameter of an integrated circuit including a first trim array and a second trim array is trimmed by measuring an initial value of the parameter, determining whether the parameter exceeds a reference value, and as long as the parameter exceeds the reference value, repetitively blowing fuses associated with binarily weighted trim elements of the first trim array to eliminate trim contributions thereof to thereby decrease the parameter by weighted amounts corresponding to a present trim array bit number value until either all fuses of the first trim array have been blown or enough have been blown to cause the parameter to be less than a −LSB/2 weight. If the parameter then is less than the −LSB/2 weight, a fuse of the second trim array corresponding to a present bit number is blown to increase the parameter to greater than a +LSB/2 weight. The procedure is repeated until all fuses in one trim array have been blown, to thereby minimize the number of residual trim elements.
REFERENCES:
patent: 4399426 (1983-08-01), Tan
patent: 6151238 (2000-11-01), Smit et al.
patent: 6433714 (2002-08-01), Clapp et al.
patent: 6448911 (2002-09-01), Somayajula
Brady W. James
Swayze, Jr. W. Daniel
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
Young Brian
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