Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – Passive components in ics
Reexamination Certificate
2006-10-10
2006-10-10
Malsawma, Lex H. (Department: 2823)
Active solid-state devices (e.g., transistors, solid-state diode
Integrated circuit structure with electrically isolated...
Passive components in ics
Reexamination Certificate
active
07119414
ABSTRACT:
A fuse layout (10) constructed of a wiring electrode made of a barrier metal layer of a high melting point and a main wiring metal layer comprises a plurality of fusion-type fuse sections (11and12) connected to each other in series and a plurality of fuse pads (13, 14, and15) for drawing current to the respective fuse sections. If only one of the fuse sections is cut, the whole fuse layout is put in the “cut condition” so that the total fraction defective of incomplete cut of the fuse layout is largely reduced. Even if the barrier metal layer is not cut to remain, it has a high resistance so that the fuse resistance of the whole fuse layout becomes very high and the fuse layout is considered in the “cut condition”.
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Malsawma Lex H.
Oki Electric Industry Co. Ltd.
Takeuchi&Kubotera,LLP
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