Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – Passive components in ics
Reexamination Certificate
2005-05-25
2009-02-24
Jackson, Jr., Jerome (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Integrated circuit structure with electrically isolated...
Passive components in ics
C365S225700, C257SE23149
Reexamination Certificate
active
07495310
ABSTRACT:
A fuse-data reading circuit is provided in a semiconductor integrated circuit device. In the fused-data reading circuit, a differential latch circuit compares a current depending on the resistance across a first fuse element, i.e., target element, with a current depending on the resistance of a series circuit including a second fuse element used as a reference fuse element and a resistor element. The differential latch circuit determines whether the first fuse element has been cut or not.
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Douzaka Toshiaki
Hayakawa Shigeyuki
Midorikawa Tsuyoshi
Tanaka Yutaka
Budd Paul A
DLA Piper (LLP) US
Jackson, Jr. Jerome
Kabushiki Kaisha Toshiba
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