Fuse circuit with controlled fuse burn out and method thereof

Details Fuse circuit with controlled fuse burn out and method thereof Fuse circuit with controlled fuse burn out and method thereof

2007-01-09

2007-01-09

Zweizig, Jeffrey (Department: 2816)

Miscellaneous active electrical nonlinear devices, circuits, and

Specific identifiable device, circuit, or system

Fusible link or intentional destruct circuit

C327S333000

Reexamination Certificate

active

10968171

ABSTRACT:
A fuse arrangement in a semiconductor device, including a fuse resistor being connected to a first voltage, and a transistor passing current to the fuse resistor, wherein a second voltage is applied to a gate of the transistor, the second voltage being greater than the first voltage. Another fuse arrangement in a semiconductor device, including a first fuse resistor having a first terminal connected to a first voltage and a second terminal connected to a first node, a second fuse resistor having a third terminal connected to the first voltage and a fourth terminal connected to a second node, and a transistor being controlled by a first signal with a second voltage, the transistor passing current to the second terminal of the first fuse resistor based on the first signal, the second voltage being greater than the first voltage. A method of burning out a fuse resistor in a fuse arrangement, including converting a received first signal with a first voltage level to a second signal with a second voltage level, the second voltage level being greater than the first voltage level, and applying the second signal to the fuse resistor.

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patent: 2000-0050451 (2000-08-01), None
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patent: 2002-0053769 (2002-07-01), None

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