Fundus imaging system

Optics: eye examining – vision testing and correcting – Eye examining or testing instrument – Objective type

Reexamination Certificate

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Details

C351S207000, C351S208000, C351S209000, C351S210000, C351S220000, C600S452000, C606S004000, C396S018000

Reexamination Certificate

active

10977434

ABSTRACT:
An apparatus (220) for obtaining a scanned image of an eye has a reference locator for pupil alignment apparatus along an optical axis. A pupil profiling apparatus for obtaining an outline of the pupil has a pupil profiling light source (176), a sensor (170) for detecting reflected light, and a control logic processor (104) for computing an outline of the pupil according to detected light. An illumination apparatus (112) for directing visible illumination into the eye has a spatial light modulator (125) for shaping an illumination beam according to the detected outline, a scanning element (229), and a camera (146) for obtaining the scanned image by sensing a portion of the reflected illumination.

REFERENCES:
patent: 4838680 (1989-06-01), Nunokawa
patent: 5572266 (1996-11-01), Ohtsuka
patent: 5713047 (1998-01-01), Kohayakawa
patent: 5943116 (1999-08-01), Zeimer
patent: 6546198 (2003-04-01), Ohtsuka
patent: 6636696 (2003-10-01), Saito
patent: 7001019 (2006-02-01), Takagi et al.

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