Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Reexamination Certificate
2007-05-10
2008-12-09
Tang, Minh N (Department: 2829)
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
C324S760020, C324S765010
Reexamination Certificate
active
07463017
ABSTRACT:
Improved methods, systems, and apparatuses are disclosed for testing LGA devices. One example embodiment include vertical routing of test nest assembly cooling lines in order to minimize the test nest footprint and increase available test sites on a single test card. Another example embodiment includes isolating and adjusting external loads and moments into the heatsink/cold plate, wherein these loads and moments involve controlling the centroid to restore more ideal thermal performance of the heatsink/chip interface. Still another example embodiment includes a nest architecture facilitating easy and low-cost replacement of LGA sockets. Finally, another example embodiment includes efficient condensation control of test nest assembly parts by using dry-air exhaust.
REFERENCES:
patent: 4848090 (1989-07-01), Peters
patent: 5489851 (1996-02-01), Heumann et al.
patent: 5977785 (1999-11-01), Burward-Hoy
patent: 6628132 (2003-09-01), Pfahnl et al.
patent: 6911836 (2005-06-01), Cannon et al.
patent: 6975028 (2005-12-01), Wayburn et al.
patent: 7100389 (2006-09-01), Wayburn et al.
patent: 2006/0071678 (2006-04-01), Norris
Corbin, Jr. John Saunders
Garza Jose Arturo
Kent Dales Morrison
Larsen Kenneth Carl
Mahaney, Jr. Howard Victor
Gerhardt Diana Roberts
International Business Machines - Corporation
Schubert Osterrieder & Nickelson PLLC
Tang Minh N
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