Function array sequencing for VLSI test system

Details Function array sequencing for VLSI test system Function array sequencing for VLSI test system

1989-04-12

1993-11-23

Baker, Stephen M.

Excavating

G01R 3128

Patent

active

052651010

ABSTRACT:
A function array system includes a controller, a test function and specific memories to accelerate the execution of a VLSI device test program by preloading register files associate with each hardware function in the tester with test set-up information. Test information is transferred to the register files only once when the test program is initially downloaded into the tester. A simple controller sequences a test set-up pointer during test execution.

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Electronics, Eugene, "Microprogramming helps check LSI RAMs and logic", Dec. 4, 1980, vol. 53, No. 26, pp. 137-141.
Electronics, Gillette, "Tester takes on VLSI with 264-K vectors behind its pins", Nov. 3, 1981, vol. 54, No. 22, pp. 122-127.
Electronics, Hansen, "Functional and in-circuit testing team up to tackle VLSI in the '80s", Apr. 2, 1981, pp. 189-195.
Electronic Production, Finnell, "In-Circuit Testing of LSI-based PCBs", Sep. 1982, pp. 47-53.

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