Fully testable CMOS comparator circuit with half-comparing stage

Details Fully testable CMOS comparator circuit with half-comparing stage Fully testable CMOS comparator circuit with half-comparing stage

1997-06-18

2000-04-04

Wambach, Margaret Rose

Communications: electrical

Digital comparator systems

G06F 702

Patent

active

060466693

ABSTRACT:
A fully testable CMOS comparator circuit is disclosed having INV and NAND logic gates which form data paths for propagating data through the comparator circuit. The data propagated through the comparator circuit include greater-or-equal signals. The comparator is fully testable because there are no redundant circuit elements.

REFERENCES:
patent: 5548270 (1996-08-01), Kim et al.
patent: 5592142 (1997-01-01), Adams et al.

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