Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2006-01-17
2006-01-17
Nguyen, Vincent Q. (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S658000
Reexamination Certificate
active
06987394
ABSTRACT:
One embodiment of the present invention provides an electronic circuit and method for measuring a capacitance. A signal generating mechanism generates a signal having a predefined frequency and predefined low and high voltage levels on one terminal of the capacitance. The other terminal of the capacitance is coupled to a switching mechanism. The switching mechanism is set to couple the other terminal of the capacitance to a first amplifier or a second amplifier for a portion of each signal cycle thereby full-wave rectifying a transient current flowing between the two terminals in the capacitance. Outputs of the first amplifier and the second amplifier are coupled to a current measurement mechanism for measuring the current. The capacitance is determined from the measured current. Several variations on this embodiment are provided.
REFERENCES:
patent: 5594353 (1997-01-01), Hemphill
patent: 5629838 (1997-05-01), Knight et al.
patent: 6728113 (2004-04-01), Knight et al.
patent: 6916719 (2005-07-01), Knight et al.
Drost Robert J.
Ho Ronald
Sutherland Ivan E.
Nguyen Vincent Q.
Park Vaughan & Fleming LLP
Sun Microsystems Inc.
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