Optics: measuring and testing – Shape or surface configuration – Triangulation
Reexamination Certificate
2006-12-01
2009-06-09
Nguyen, Sang (Department: 2886)
Optics: measuring and testing
Shape or surface configuration
Triangulation
C356S604000, C356S605000, C356S602000
Reexamination Certificate
active
07545516
ABSTRACT:
A method and system for full-field fringe-projection for 3-D surface-geometry measurement, referred to as “triangular-pattern phase-shifting” is disclosed. A triangular grey-scale-level-coded fringe pattern is computer generated, projected along a first direction onto an object or scene surface and distorted according to the surface geometry. The 3-D coordinates of points on the surface are calculated by triangulation from distorted triangular fringe-pattern images acquired by a CCD camera along a second direction and a triangular-shape intensity-ratio distribution is obtained from calculation of the captured distorted triangular fringe-pattern images. Removal of the triangular shape of the intensity ratio over each pattern pitch generates a wrapped intensity-ratio distribution obtained by removing the discontinuity of the wrapped image with a modified unwrapping method. Intensity ratio-to-height conversion is used to reconstruct the 3-D surface coordinates of the object. Intensity-ratio error compensation involves estimating intensity-ratio error in a simulation of the measurement process with both real and ideal captured triangular-pattern images obtained from real and ideal gamma non-linearity functions. A look-up table relating the measure intensity-ratio to the corresponding intensity-ratio error is constructed and used for intensity-ratio error compensation. The inventive system is based on two-step phase-shifting but can be extended for multiple-step phase-shifting.
REFERENCES:
patent: 4349277 (1982-09-01), Mundy et al.
patent: 4564295 (1986-01-01), Halioua
patent: 4641972 (1987-02-01), Halioua et al.
patent: 5444537 (1995-08-01), Yoshimura et al.
patent: 6438272 (2002-08-01), Huang et al.
patent: 6788210 (2004-09-01), Huang et al.
patent: 7098956 (2006-08-01), Keitel et al.
Almazan-Cuellar, S., and Malacara-Hernandez, D., “Two-Step Phase-Shifting Algorithm” Opt. Eng., 42(12) pp. 3524-3531 (2003).
Ayache, H., and Faverjon, B., “Efficient Registration of Stereo Images by Matching Graph Descriptions of Edge Segments” Int'l Journal of Computer Vision, 1(2)7 pp. 107-131 (1987).
Batlle, J., Mouaddib, E., and Salvi, J., “Recent Progress in Coded Structured Light as a Technique to Solve the Correspondence Problem: A Survey” Pattern Recognition, vol. 31 No. 7 pp. 963-982 (1998).
Beraldin, J.-A., Blais, F., Cournoyer L., Godin, G., and Rious, M., “Active 3D Sensing” published in The e-Way into the Four Dimensions of Cultural Heritage Congress. Vienna, Austria. NRC 46495 (Apr. 8-12, 2003).
Besl, P., “Active Optical Range Imaging Sensors” Advances in machine Vision, pp. 1-63, Springer-Verlag (1989).
Blais, F., “Control of Low Inertia Galvanometers for High Precision Laser Scanning Systems” Opt. Eng., 27, pp. 104-110(1988).
Blais, F., Beraldin, J.A., and El-Hakim, S., “Real-Time 3D Pose Estimation Using Photogrammetry and Laser Based Geometrical Target Tracking for Autonomous Operation in Space” Proceedings of the 5thConference on Optical 3-D Measurement Techniques. Vienna, Austria (Oct. 1-3, 2001).
Blais, F., “A Review of 20 Years of Range Sensor Development” Proc. Of SPIE-IS&T Electronic Imaging, SPIE vol. 5013, pp. 62-76 (2003).
Box, G.E.O, and Muller, M.A., “A Note on the Generation of Random Normal Deviates” Annals Math, Stats, V. 29 610-611 (1958).
Boyer, K., and Kak, A., “Collor-Encoded Structured Light for Rapid Active Ranging” IEEE Trans. Pattern Analysis and Machine Intelligence, pp. 14-28 (1987).
Cao, Y., and Su, X. “RGB Tricolor Based Fast Phase Measuring Profilometry” Proc. SPIE, vol. 4919, pp. 528-535 (2002).
Carrihill, B. and Hummel, R., “Experiments With the Intensity-Ratio Depth Sensor” In Computer Vision, Graphics and Image Processing, vol. 32, pp. 337-358, Academic Press (1985).
Chaing, F. P., “A Shadow Moire Method With Two Discrete Sensitivities” Exper. Mech. 15 (10) pp. 384-385 (1975).
Chazan, G. and Kiryati, N., “Pyramidal Intensity-Ratio Depth Sensor” Technical Report 121, Center for Communication and Information Technologies, Department of Electrical Engineering, Technion, Haifa, Isreal (Oct. 1995).
Chen , C., Hung, Y., Chiang, C., and Wu, J., “Range Data Acquisition Using Color Structured Lighting and Stereo Vision” Image and Vision Computing, vol. 15, pp. 445-456(1997).
Chen, X., Gra,aglia, M., and Yeazell, J., “Phase-Shift Calibration Algorithm for Phase-Shifiting Interferometry” Journal of the Optical Society of America A, vol. 17, No. 11 pp. 2061-2066 (Nov. 2000).
Choi, Y.B. and Kim, S. W., “Phase Shifting Grating Projection Moire Topography” Opt. Eng. 37, pp. 1005-1010 (1198).
Creath, K., “Phase-Measurement Interferometry Techniques” in Progress in Optics. vol. XXVI, E. Wolf. Ed. Elsevier Science Publishers, Amsterdam, pp. 349-393 (1988).
Cunningha, R. and Yakimovsky, Y., “A System for Extracting Three-Dimensional Measurement for a Stereo Pair of TV Camers” Computer Graphics and Image Processing, pp. 195-210 (Jul. 1978).
El-Hakim, S. F. Beraldin, J.=-A., and Blais, F., “A Comparative Evaluation of the Performance of Passive and Active 3-D Vision Systems” St. Petersburg Conference on Digital Photogrammetry, Proc. SPIE, 2646, pp. 14-25 (Jun. 1995).
Fang, Q., “Linearly Coded Profilometry With a Coding Light That Has Isosceles Triangle Teeth: Even-Number-Sample Decoding Method” Applied Optics, 36, pp. 1615-1620 (1997).
Fabg, Q. and Zheng, S., “Linearly Coded Profilometry” Appl. Opt. 36, pp. 2401-2407 (1997).
Frankowski G, Chen M, Huth T, “Real-Time 3D Shape Measurement With Digital Strip Projection by Texas Instruments Micromirro Devices DMD” Three-dimensional image capture and applications III, Corner BD, Nurre JH, eds, Proc SPIE, 2000; 3958: 90-105.
Freischlad, K., and Koliopoloulos, C., “Fourier Description of Digital Phasemeasuring Interferometry” Journal of the Optical Society of America A. vol. pp. 542-551 (1990).
Fujigaki, M. and Morimoto, Y., “Accuracy of Real-Time Shape Measurement by Phase-Shifting Grid Method Using Correlation” JSME International Journal, Series A, vol. 43, No. 4, pp. 314-320 (2000).
Geng, Z. J., “Rainbow 3-D Camera: New Concept of High-Speed Three Vision System” Opt. Eng., vol. 35, pp. 376-383 (1996).
Giovanna Sansoni, Marco Trebeschi and Franco Docchio, “Fast 3D Profilometer Based Upon the Projection of a Single Fringe Pattern and Absolute Calibration” Meas. Sci. Technol 17, pp. 1757-1766 (2006).
Goldstein, R.M., Zebker, H.A., and Werner, C.L., “Satellite Radar Interferometry: Two-Dimensional Phase Unwrapping” Radio Science, vol. 23, No. 4, pp. 713-720 (1988).
Gorecki, C., “Interferogram Analysis Using A Fourier Transform Method for Automatic 3D Surface Measurement” Pure Appl. Opt., vol. 1, pp. 103-110(1992).
Gray, S., “In Virtual Fashion” IEEE Spectrum, 35 (2), 18-25 (Feb. 1998).
Greivenkamp, J.E. and Bruning, J.H., “Optical Shop Testing” Chapter 4: Phase Shifting Interferometry, John Wiley and Sons, Inc., pp. 501-598 (1992).
Gu, J. and Chen, F., “Fast Fourier Transform, Iteration, and Least-Square-Fit Demodulation Image Processing for Analysis of Single-Carrier Fringe Pattern” Journal of the Optical Society of America A, vol. 12, pp. 2159-2164 (1995).
Guan, C., Hassebrook, L.G., and Lau, D.L. “Real-Time 3-D Data Acquisition for Augmented Reality Man and Machine Interfacing” Visualization of Temporal and Spatial Data for Civilian and Defense Applications V, SPIE's AeroSense, vol. 2097A-5 (2003).
Hall-Holt, O. and Rusinkiewicz, S., “Stripe Boundary Codes for Real-Time Structured-Light Range Scanning of Moving Objects” In Int. Conf. on Computer Vision, pp. 359-366 (2001).
Harding, K.G., “Phase Grating Using for Slop Discrimination in
English Chad
Jia Peirong
Kofman Jonathan David
Husch Blackwell Sanders LLP Welsh & Katz
Nguyen Sang
University of Waterloo
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