Full chip integrated circuit tester

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor

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324 73R, 357 52, G01R 3102, H01L 2934

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active

048454257

ABSTRACT:
Contactless probing of an integrated circuit is carried out by flooding the surface of the integrated circuit with pulsed ultraviolet laser light, causing photoelectron emission as a function of the potentials at micropoints on the integrated circuit, converting this two-dimensional electron pattern into a corresponding relatively long duration pattern of luminescence by a luminescent target, and reviewing the result by video/computer scanning. Separate embodiments allow testing either in vacuum or in air, with or without insulating passivation layers present on the chip. The result is a contactless oscilloscope which monitors instantaneous voltages (logic states and AC switching waveforms) for a full two-demsnsional array of micropoints simultaneously. A chip with test points and appropriate windows for laser activation and luminescent targeting can be specially designed for optimal testing.

REFERENCES:
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patent: 4431967 (1984-02-01), Nishioka
patent: 4464627 (1984-08-01), Munakata et al.
patent: 4609867 (1986-09-01), Schink
patent: 4642565 (1987-02-01), Jastrzebski et al.
Rubloff, G. W.; "Contactless Measurement . . . "; IBM Tech. Dis. Bull.; vol. 25; No. 3A; Aug. 1982; pp. 1171-1172.
Henley, F. J.; "An Automated . . . "; IEEE 1984 Int. Test Con.; 1984; pp. 536-542.
Baxter et al.; "A Photemission . . . ", Rev. Sci. Instrum.; vol. 44; No. 11; Nov. 1973; pp. 1628-1629.
Macari et al.; "Automated Contactless . . . "; 1982 IEEE/Proc. IRPS; Mar. 30, 31, 1982; pp. 163-166.

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