Fringe scanning point diffraction interferometer by polarization

Details Fringe scanning point diffraction interferometer by polarization Fringe scanning point diffraction interferometer by polarization

1986-06-26

1988-08-09

McGraw, Vincent P.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

356354, G01B 902

Patent

active

047624175

ABSTRACT:
A polarization fringe scanning digital interferometer includes an encoder r performing a phase polarization encoding on the wavefront coming from the optical component under test as it passes through the encoder. The encoded wavefront then passes through an analyzer into a video camera to produce electrical signals representing the interference pattern. The encoder includes in sequence, a polarizer having an adjustable polarization axis, a polarization film providing a polarization pinhole through the film and a quarter wave plate that preferably is a Fresnel plate.

REFERENCES:
patent: 4575247 (1986-03-01), Tansey
patent: 4624569 (1986-11-01), Kwon

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