Optics: measuring and testing – Shape or surface configuration – Triangulation
Reexamination Certificate
2008-03-05
2010-10-26
Nguyen, Sang (Department: 2886)
Optics: measuring and testing
Shape or surface configuration
Triangulation
C356S622000, C356S447000
Reexamination Certificate
active
07821649
ABSTRACT:
A probe includes an insertion tube and a plurality of light emitters disposed on the distal end of the insertion tube. The probe further includes at least one intensity modulating element through which light from the plurality of light emitters is passed to project a plurality of fringe sets onto a surface. Each of the plurality of fringe sets intern have a structured-light pattern that is projected when one emitter group of at least one of the plurality of light emitters is emitting. The probe further includes an imager for obtaining at least one image of the surface and a processing unit that is configured to perform phase-shift analysis on the at least one image. A method for projecting a plurality of fringe sets suitable for phase-shift analysis on a surface using a probe is also presented.
REFERENCES:
patent: 4988886 (1991-01-01), Palum et al.
patent: 5066119 (1991-11-01), Bertrand
patent: 5069548 (1991-12-01), Boehnlein
patent: 5135308 (1992-08-01), Kuchel
patent: 5307152 (1994-04-01), Boehnlein et al.
patent: 5386292 (1995-01-01), Massen
patent: 5434669 (1995-07-01), Tabata
patent: 5835218 (1998-11-01), Harding
patent: 5847832 (1998-12-01), Liskow
patent: 6084712 (2000-07-01), Harding
patent: 6088105 (2000-07-01), Link
patent: 6100984 (2000-08-01), Chen
patent: 6291817 (2001-09-01), Kobayashi et al.
patent: 6438272 (2002-08-01), Huang et al.
patent: 6950191 (2005-09-01), Ge
patent: 6977732 (2005-12-01), Chen et al.
patent: 7170677 (2007-01-01), Bendall et al.
patent: 7286246 (2007-10-01), Yoshida
patent: 7433058 (2008-10-01), Cantin et al.
patent: 2002/0163573 (2002-11-01), Bieman et al.
patent: 2003/0043387 (2003-03-01), Lim
patent: 2005/0046872 (2005-03-01), Hu et al.
patent: 2005/0099638 (2005-05-01), Quadling
patent: 2006/0132790 (2006-06-01), Gutin
patent: 2006/0282009 (2006-12-01), Oberg
patent: 2007/0109558 (2007-05-01), Harding et al.
patent: 2009/0225329 (2009-09-01), Bendall et al.
patent: 59192223 (1984-10-01), None
EP Search Report Issued in connection with corresponding EP Patent Application No. 09165205.7 filed on Jul. 10, 2009.
Bieman et al., “Absolute Measurement using Field Shift Moire,” SPIE Proceedings vol. 1614, Optics, Illumination and Image Sensing for Machine Vision VI, Boston, Massachusetts, Nov. 1991.
Boehnlein et al,, “Fieid Shift Moire, a New Technique for Absolute Range Measurement,” SPIE Conference 1163, Fringe Analysis Methods, San Diego, California, Aug. 1989.
Harding, “Latest Optical Methods for Industrial Dimensional Metrology,” Proceedings SPIE vol. 6000, 600001, Two- and Three-Dimensional Methods for Inspection and Metrology III, 2005.
Harding et al., “Machine Vision Method for Small Feature Measurements.” Tang Publication: Proc. SPIE vol. 5606, p. 153-160, Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology II; 2004.
Bendall Clark Alexander
Harding Kevin George
Karpen Thomas
Song Guiju
Tao Li
Conklin Mark A.
GE Inspection Technologies LP
Global Patent Operation
Nguyen Sang
LandOfFree
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