Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1991-11-25
1993-10-19
Turner, Samuel A.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356345, 356 44, 374131, G01B 902
Patent
active
052550680
ABSTRACT:
A sensor for use in an optical temperature detector system having a birefringent element made of a single crystal metal oxide plate. A broad band light spectrum is transmitted through a first linear polarizing element to create a linearly polarized wave. The linearly polarized wave on passing through the single crystal metal oxide plate decomposes into first and second orthogonally polarized waves. Propagation of the linearly polarized wave through the birefringent single crystal metal oxide plate introduces a temperature dependent phase shift between the two waves. Thereafter, a second linear polarizer combines the first and second orthogonally polarized waves to create a modulated light spectrum having a fringe pattern, the fringe pattern being a function of the current temperature experienced by said birefringent element. A fiber optic cable connected to the second linear polarizing element carries the modulated light spectrum to an opto-electronic interface where the fringe pattern is extracted and a computer compatible signal is generated for a CPU to accurately indicate current environmental temperature conditions up to 1000.degree. C. experienced by the single crystal plate crystal in the birefringent element.
REFERENCES:
patent: 4598996 (1986-07-01), Taniuchi
patent: 4867565 (1989-09-01), Lequime
patent: 4928005 (1990-05-01), Lefevre et al.
patent: 5113472 (1992-05-01), Gualtieri et al.
Emo Stephen M.
Gualtieri Devlin M.
Hou Janpu
Kinney Terrance R.
Morris Robert C.
Allied-Signal Inc.
McCormick Jr. Leo H.
Palguta Larry J.
Turner Samuel A.
Walsh Robert A.
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