Fringe deflectometry apparatus and method

Details Fringe deflectometry apparatus and method Fringe deflectometry apparatus and method

1998-01-08

2000-03-28

Kim, Robert H.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

356127, 356124, G01B 902, G01B 900

Patent

active

060438851

ABSTRACT:
A fringe deflectometry apparatus illuminates an optical component to be measured using radiation with a known wavefront, deflects the radiation after it has been reflected or transmitted by the optical component to be measured, and materializes a reference ray. Transverse aberration of the reference ray after reflection or transmission by the optical component is measured. A deflectometry method using the apparatus enables an absolute phase reference to be provided.

REFERENCES:
patent: 5066119 (1991-11-01), Bertrand
patent: 5581347 (1996-12-01), Le Saux et al.

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