Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate
2005-04-19
2005-04-19
Hannaher, Constantine (Department: 2878)
Optics: measuring and testing
By light interference
For dimensional measurement
C356S513000, C356S514000, C356S515000, C356S519000
Reexamination Certificate
active
06882432
ABSTRACT:
The invention features methods and systems in which wavelength-tune PSI data is analyzed in the frequency domain to produce spectrally separated frequency peaks each corresponding to a particular pair of surfaces in an interferometric cavity defined by multiple pairs of surfaces. Each frequency peak provides optical path length information about a corresponding pair of surfaces in the cavity. As a result, the interferometric data from such cavities provides simultaneous information about multiple surfaces.
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Fish & Richardson P.C.
Hannaher Constantine
Lee Shun
Zygo Corporation
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