Frequency-scanning particle size spectrometer

Details Frequency-scanning particle size spectrometer Frequency-scanning particle size spectrometer

1979-08-10

1982-05-11

McGraw, Vincent P.

Optics: measuring and testing

For size of particles

By particle light scattering

356338, G01N 1502

Patent

active

043290531

ABSTRACT:
A particle size spectrometer having a fixed field of view within the forward light scattering cone at an angle .theta..sub.s between approximately 100 and 200 minutes of arc (preferably at 150 minutes), a spectral range extending approximately from 0.2 to 4.0 inverse micrometers (.mu.m.sup.-1), and a spectral resolution between about 0.1 and 0.2 .mu.m.sup.-1 (preferably toward the lower end of this range of spectral resolution), is employed to determine the distribution of particle sizes, independently of the chemical composition of the particles, from measurements of incident light, I.sub.o, at each frequency, .sigma. (=1/.lambda.), and scattered light, I(.sigma.), according to the equation: ##EQU1## where l=2.pi.sin.theta., .theta. being the fixed viewing angle .theta..sub.s at which scattered light is measured, r is particle size, .sigma. is the reciprocal of wavelength, J.sub.1 is a Bessel function of first kind and order unity, Y.sub.1 is a Bessel function of second kind and order unity. The quantity, I.sub..sigma., is the ratio of scattered light to incident light at each frequency interval. The apparatus is a passive remote sensor that can be used in laboratories, field stations, flying aircrafts and airships, and on board an orbiting satellite.

REFERENCES:
patent: 2788702 (1957-04-01), Baum, Jr.
patent: 3724951 (1973-04-01), Seelbinder

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