Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing
Reexamination Certificate
2006-06-20
2006-06-20
Wachsman, Hal (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Measured signal processing
C702S189000, C702S075000, C702S076000, C702S191000
Reexamination Certificate
active
07065474
ABSTRACT:
Frequency rectification system using a Van der Pol oscillator for processing an asset signal by obtaining a complex signal from an asset comprised of a noise signal and a signal of interest having a corresponding frequency of interest wherein the complex signal includes a first spectrum having all of its largest spectral peaks corresponding to the noise signal such that the signal of interest is hidden under the noise signal. The system processes the complex signal with the Van der Pol oscillator with selected parameters for rectifying the complex signal into a rectified signal such that the noise signal is abated and the rectified signal is comprised of a second spectrum having a largest spectral peak corresponding to the signal of interest with all other spectral peaks smaller. The system extracts the frequency of interest from the rectified signal with an extraction module for use in providing asset information.
REFERENCES:
patent: 6401057 (2002-06-01), Kadtke et al.
patent: 6499002 (2002-12-01), Lancaster
patent: 6522996 (2003-02-01), Groutage
Malakhova Olga
Petchenev Alexei
Bently Nevada LLC
DeBoo Dennis A.
Wachsman Hal
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