Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1983-07-07
1985-06-18
Willis, Davis L.
Optics: measuring and testing
By particle light scattering
With photocell detection
356351, 356364, G01B 902
Patent
active
045238472
ABSTRACT:
A method and device for detecting dichroic and/or birefringent narrow spectral features in a sample is described. The method includes the steps of providing a beam of light having an optical frequency bandwidth which is narrow compared to the width of the narrow spectral feature and having a center frequency .omega..sub.c which lies near the narrow spectral feature, polarization phase modulating a beam of light with a single RF frequency to provide a pure FM spectrum having upper and lower sidebands in which either the carrier and sidebands have been polarized with respect to one another, exposing the sample containing the narrow spectral feature to the polarized modulated light so that the FM sidebands probe the narrow spectral feature, polarization analyzing and then photodetecting the light emerging from the sample to detect a RF beat at the specific RF frequency used for the polarization phase modulation, and electronically monitoring the amplitude of the RF beat signal to indicate the strength of the narrow spectral feature. The device includes a polarization phase modulator and a polarization analyzer positioned on opposite sides of the sample. In a preferred embodiment the polarization phase modulator produces a frequency modulated optical spectrum with the sidebands polarized precisely orthogonal to the carrier.
REFERENCES:
patent: 4297035 (1981-10-01), Bjorklund
Azzam, "Frequency-Mixing Detection (FMD) of Polarization-Modulated Light", J. Opt. Soc. Am., vol. 66, No. 7, pp. 735-739, 7/76.
Bjorklund Gary C.
Levenson Marc D.
International Business Machines - Corporation
Kieninger Joseph E.
Korey Matthew W.
Willis Davis L.
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