Frequency margin testing of bladed servers

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C702S075000, C702S076000, C702S085000, C702S106000, C702S124000, C324S520000, C324S076190, C327S050000, C327S306000, C708S311000, C708S309000, C709S223000, C709S224000, C713S400000, C713S501000

Reexamination Certificate

active

06856926

ABSTRACT:
A frequency margin testing blade is adapted for use in a bladed server. The testing blade is further adapted to provide one or more output clock signals for use as clock inputs to one or more server blades internal to the bladed server in which the testing blade is installed and/or one or more server blades external to the bladed server in which the testing blade is installed.

REFERENCES:
patent: 4490821 (1984-12-01), Lacher
patent: 5486753 (1996-01-01), Khazam et al.
patent: 6484124 (2002-11-01), MacMullen
patent: 6535986 (2003-03-01), Rosno et al.
patent: 20030188222 (2003-10-01), Abbondanzio et al.
patent: 20040034486 (2004-02-01), Iannuzzi
Hewlett-Packard Company, HP Manageability Solution Brief: HP Blade Server Environment, Apr. 2002.
Hewlett-Packard Company, HP Blade Server Data Sheet, Dec. 2001.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Frequency margin testing of bladed servers does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Frequency margin testing of bladed servers, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Frequency margin testing of bladed servers will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3445759

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.