Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2005-02-15
2005-02-15
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S075000, C702S076000, C702S085000, C702S106000, C702S124000, C324S520000, C324S076190, C327S050000, C327S306000, C708S311000, C708S309000, C709S223000, C709S224000, C713S400000, C713S501000
Reexamination Certificate
active
06856926
ABSTRACT:
A frequency margin testing blade is adapted for use in a bladed server. The testing blade is further adapted to provide one or more output clock signals for use as clock inputs to one or more server blades internal to the bladed server in which the testing blade is installed and/or one or more server blades external to the bladed server in which the testing blade is installed.
REFERENCES:
patent: 4490821 (1984-12-01), Lacher
patent: 5486753 (1996-01-01), Khazam et al.
patent: 6484124 (2002-11-01), MacMullen
patent: 6535986 (2003-03-01), Rosno et al.
patent: 20030188222 (2003-10-01), Abbondanzio et al.
patent: 20040034486 (2004-02-01), Iannuzzi
Hewlett-Packard Company, HP Manageability Solution Brief: HP Blade Server Environment, Apr. 2002.
Hewlett-Packard Company, HP Blade Server Data Sheet, Dec. 2001.
Mastoris Steve
Monfared Akbar
Schrader Rex
Desta Elias
Hewlett--Packard Development Company, L.P.
Hoff Marc S.
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