Frequency domain reflectometry system for baselining and...

Details Frequency domain reflectometry system for baselining and... Frequency domain reflectometry system for baselining and...

2005-08-30

2005-08-30

Hoff, Marc S. (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C324S534000

Reexamination Certificate

active

06937944

ABSTRACT:
A system that utilizes the principles of frequency domain reflectometry to perform baselining and mapping of single and mutliple wires and cables, the baselining to be used as a comparison when the wires are tested at a later date to determine if the wires or cables have been damaged, wherein a first waveform is generated from a baseline FDR measurement of a cable, a second waveform is generated from a new FDR measurement of the cable, and a comparison of the first and second waveforms is performed to determine if the integrity of the cable has changed, and wherein the mapping is performed in order to determine the present configuration of a network or tree of wires or cables.

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patent: 2004/0015311 (2004-01-01), Furse et al.

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