Frequency analyzer for sub-microsecond testing

Details Frequency analyzer for sub-microsecond testing Frequency analyzer for sub-microsecond testing

1993-04-14

1996-01-16

Wieder, Kenneth A.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Parameter related to the reproduction or fidelity of a...

324618, 324 7654, 341120, 331 44, G01R 2300

Patent

active

054851017

ABSTRACT:
A method and apparatus for measuring the settling time of frequency changes in a voltage controlled oscillator (VCO) are disclosed. A signal splitter is responsive to the VCO for splitting the output signal between first and second channels. A delay circuit in one of the channels introduces a delay and corresponding phase shift of one signal relative to the other, and a phase detector produces a phase signal proportional to the phase shift indicative of the settling time of the VCO. A control circuit coupled to the phase detector and the VCO produces a step voltage initiating signal for changing the VCO output frequency. A detector responsive to the initiating signal and the phase signal produces an output indicative of the settling time with respect to the control signal in the modulation domain.

REFERENCES:
patent: 3852681 (1974-12-01), Underhill
patent: 4578641 (1986-03-01), Tiedje

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