Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-12-12
2006-12-12
Nguyen, Vinh P. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S761010
Reexamination Certificate
active
07148709
ABSTRACT:
A rigid column and a suspension knee are combined in a probe held in assembly via its column. The suspension knee has a base arm laterally connecting at and propagating away from the column. The base arm extends up to a lateral knee extension where a reverse arm continues from the base arm back in direction towards a central axis of the column. The reverse arm terminates in a contact tip in a tip offset to the column axis that is smaller than the lateral knee extension. During application of a contacting force onto the contact tip, a first deflection of the base arm and a second deflection of the reverse arm counter act in conjunction with base and reverse arms' structural configurations. As a result, scrub motion may be well defined in direction and magnitude without need for additional guidance of the deflecting probe structure.
REFERENCES:
patent: 4773877 (1988-09-01), Kruger et al.
patent: 4967148 (1990-10-01), Doemens et al.
patent: 5923178 (1999-07-01), Higgins et al.
patent: 5952843 (1999-09-01), Vinh
patent: 6633176 (2003-10-01), Takemoto et al.
Micro-Probe, Inc.
Nguyen Vinh P.
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