Frame for holding a bladed element of an IC handling system

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

3241581, G01R 3102

Patent

active

060182482

ABSTRACT:
A frame for holding a bladed element of a test socket is used in an IC handling system. The frame includes a face, a rim formed on the face, a detent formed on the rim so that the rim and the detent are capable of holding the bladed element. The detent includes a hook having a beveled edge for holding the bladed element.

REFERENCES:
patent: 3391383 (1968-07-01), Antes
patent: 4509810 (1985-04-01), Erlam et al.
patent: 4560216 (1985-12-01), Egawa
patent: 4615441 (1986-10-01), Nakamura
patent: 4758176 (1988-07-01), Abe et al.
patent: 5009608 (1991-04-01), Shipe
patent: 5086269 (1992-02-01), Nobi
patent: 5226826 (1993-07-01), Nillson et al.
patent: 5244404 (1993-09-01), Kishi et al.
patent: 5331284 (1994-07-01), Jean et al.
patent: 5387120 (1995-02-01), Marks et al.
patent: 5517125 (1996-05-01), Posedel et al.
patent: 5519332 (1996-05-01), Wood et al.
patent: 5562473 (1996-10-01), Ikeya et al.
patent: 5634267 (1997-06-01), Farnworth et al.
patent: 5729147 (1998-03-01), Schaff

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Frame for holding a bladed element of an IC handling system does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Frame for holding a bladed element of an IC handling system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Frame for holding a bladed element of an IC handling system will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2318185

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.