Cleaning and liquid contact with solids – Processes – Including application of electrical radiant or wave energy...
Reexamination Certificate
2007-06-12
2007-06-12
Carrillo, Sharidan (Department: 1746)
Cleaning and liquid contact with solids
Processes
Including application of electrical radiant or wave energy...
C134S001100, C134S002000, C134S003000, C134S026000, C134S027000, C134S028000, C134S029000, C134S034000, C134S036000, C134S041000, C134S902000
Reexamination Certificate
active
10447581
ABSTRACT:
An embodiment of the invention is a method of cleaning a material stack2that has a hard mask top layer8. The method involves cleaning the material stack2with a fluorine-based plasma etch. The method further involves rinsing the material stack2with a wet clean process.
REFERENCES:
patent: 6211035 (2001-04-01), Moise et al.
patent: 6288357 (2001-09-01), Dyer
patent: 6453914 (2002-09-01), Torek et al.
patent: 6475922 (2002-11-01), Zheng
patent: 6533948 (2003-03-01), Kato et al.
patent: 6566228 (2003-05-01), Beintner et al.
patent: 2001/0034106 (2001-10-01), Moise et al.
patent: 2002/0064920 (2002-05-01), Trivedi
patent: 2002/0127766 (2002-09-01), Ries et al.
patent: 2002/0177323 (2002-11-01), Grewal et al.
patent: 2004/0043526 (2004-03-01), Ying et al.
Hall Lindsey H.
Summerfelt Scott R.
Brady W. James
Carrillo Sharidan
Keagy Rose Alyssa
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
LandOfFree
FRAM capacitor stack clean does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with FRAM capacitor stack clean, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and FRAM capacitor stack clean will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3885885