FRAM capacitor stack clean

Cleaning and liquid contact with solids – Processes – Including application of electrical radiant or wave energy...

Reexamination Certificate

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C134S001100, C134S002000, C134S003000, C134S026000, C134S027000, C134S028000, C134S029000, C134S034000, C134S036000, C134S041000, C134S902000

Reexamination Certificate

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10447581

ABSTRACT:
An embodiment of the invention is a method of cleaning a material stack2that has a hard mask top layer8. The method involves cleaning the material stack2with a fluorine-based plasma etch. The method further involves rinsing the material stack2with a wet clean process.

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patent: 6475922 (2002-11-01), Zheng
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patent: 6566228 (2003-05-01), Beintner et al.
patent: 2001/0034106 (2001-10-01), Moise et al.
patent: 2002/0064920 (2002-05-01), Trivedi
patent: 2002/0127766 (2002-09-01), Ries et al.
patent: 2002/0177323 (2002-11-01), Grewal et al.
patent: 2004/0043526 (2004-03-01), Ying et al.

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