Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1994-04-11
1995-06-06
Turner, Samuel A.
Optics: measuring and testing
By particle light scattering
With photocell detection
356346, G01B 902
Patent
active
054227216
ABSTRACT:
A Fourier-transform spectrometer includes a plurality of detectors (118-1 through 118-L), each of which receives light from a pair of optical paths of different optical path lengths. A movable mirror (116) varies the difference between the path lengths of each pair. Analog-to-digital converters (124-1 through 124-L) sample the resultant outputs at regular distance-difference intervals so as to generate sequences of sample values. The distance-difference ranges for the pairs of paths associated with different detectors are different, and the sequences together make up a synthetic interferogram that covers a range of distance differences 2L times the range of motion of the movable mirror (116). A Fourier transformation circuit (126) computes the Fourier transform of the synthetic interferogram, thereby determining the power spectrum of the incoming light, and operates a display (128) to indicate the result.
REFERENCES:
patent: 4596466 (1986-06-01), Ulrich
patent: 5321501 (1994-06-01), Swanson et al.
BJ Lin et al. "Interferometric Complex Filter" IBM Tech. Disclosure vol. 16, No. 8, Jan. 1974, pp. 2587-2589.
Anderson Terry J.
Eisenberg Jason D.
Northrop Grumman Corporation
Turner Samuel A.
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